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Latest issues of B&S and ECE Magazine
ECE Magazine
Cover Story:
Partitioning a single-chip system for safe and non-safe applications
B&S Magazine
Cover Story:
AMD G-Series SOC integrates CPU, GPU and I/O controller onto a single die
Exposing test coverage to achieve better software integration
By Amit Ronen, Wind River
Even when software development complies with best practices, the integration stage can often reveal latent bugs or, worse, hide them. As complexity escalates, finding bugs reliably demands a new approach to integration and validation, which is introduced in this article.
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