Insights into RF-resistant ICs in automotive applications

langer

By Peter Michak, Langer

Radiated RF interference with LIN ICs may endanger vehicle safety. Exact evaluation of the current and voltage voltage characteristics of an IC through a radiated RF test allows to investigate the cause of an IC malfunction.

Linbus systems are used to cross-link vehicle components in automotive engineering. Integrated Lin circuits (Lin ICs) are the systems' central communication nodes. Malfunctions in individual vehicle component groups may be the result of radiated RF interferences with the Lin IC function. The Lin IC's immunity to radiated RF is thus crucial for a vehicle's functional safety. Exact knowledge of the IC characteristics under the influence of radiated RF is valuable from two points of view. IC developers can comprehensively and directly influence the improvement of an IC's immunity to RF disturbances.

Furthermore, information about the detailed EMC characteristics of a selected IC is also very important during Lin assembly development since it allows the engineers to plan an optimum EMC environment. More and more developers of new products are calling for a more detailed determination of the IC EMC characteristics. This alone allows them to cope with the apparently conflicting demands for faster development cycles and reductions in development costs on the one hand and a high product reliability and functionality on the other. New approaches to finding this information are thus in great demand...

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